Application NotesNovel Optical Design of Field Emission SEMsInnovations in Gemini column, detection technology and variable pressure technology
Product BrochuresZEISS integrated atomic force microscope: Your only true in situ AFM solution for FE-SEMs and FIB-SEMs
Application NotesIdentifying raw materials directly through paper sacks using handheld Vaya Raman spectrometer
Application NotesExplosives detection through opaque containers with Agilent Resolve—a handheld Raman analyzer
Application NotesDetection of hazardous narcotics and new psychoactive substances (NPS) with Agilent Resolve—a handheld Raman analyzer
Application NotesStabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization
Application NotesCarrier profiling in high vacuum using scanning spreading resistance microscopy and scanning capacitance microscopy
Application NotesCapturing the full potential: Surface potential imaging of soft structures via sideband KPFM
Application NotesStabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization via dual-frequency resonance tracking