Your guide to EDS analysis in electron microscopy

29 Jul 2024
Charlie Carter
Life Sciences Editor

Harness energy-dispersive X-ray spectrometry (EDS) to transform your scanning electron microscopy (SEM) research with this free guide which covers:

  • Questions EDS can answer
  • How to prepare biological specimens for EDS
  • Benefits of combining EDS with advanced SEM techniques
  • The ideal EDS detector

Explore a variety of application resources and find out how to enhance your EM research using EDS. Download to discover how EDS can provide invaluable compositional information to greyscale ultrastructural images via color EM, how to select your detector for low-energy X-ray analysis, and how EDS can unlock a simpler and smarter sample preparation.

Ultim® Extreme

Oxford Instruments

Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.

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Ultim Max and AZtecLive

Oxford Instruments

AZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their samples in the SEM.

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