Investigating Solid State Materials using SEM with Integrated Raman Spectrometers

The following application note presents the use of non-destructive Raman spectroscopy for the detection, identification and quantification of solid state materials, such as graphene. In addition to the elemental analysis provided by energy dispersive x-ray (EDX) analysis as part of SEM, Raman analysis allows elucidation of many material characteristics, such as strain, stress and doping.