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Combined QCM-D/Ellipsometry Setup for Real-Time Characterization of Thin Molecular Films
27 Jan 2017Several surface sensitive techniques are able to monitor the formation and properties of thin molecular films on a sensor surface but as the complexity of the studied systems increases, one technique alone can often not provide all desired insight. This application note presents how a combined experimental setup of Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) and ellipsometry can augment the measurement of molecular behavior at a sensor surface.
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Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Surface Area TestingPhysisorption studies fundamental parameters essential for the characterization of materials such as the specific surface area and pore size distribution. Properties such as porosity, strength, hardness, permeability, separation selectivity, corrosion, and thermal stress resistance can all be directly correlated to the porous structure of a material.ProfilometersProfilometers are instruments used to measure a surface's profile, in order to quantify etch depth, deposited film thickness, and surface roughness. They operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements.Quartz Crystal MicrobalanceThin Films