Analysis of NIST® Gold Nanoparticles Reference Materials Using the NexION 300 ICP-MS in Single Particle Mode
21 Apr 2013This application note explores the capability of modern ICP-MS to measure the key characteristics of metal manufactured nanoparticles. ICP-MS is rapidly becoming the elemental measurement technique of choice for assessing the manufacturing and environmental life cycle of engineered nanoparticles. In Standard mode, an ICP-MS provides accurate composition and concentration measurements. In Single Particle mode (SP-ICP-MS), it allows the differentiation between ionic and particulate signals, measures particle sizes (if shape is known), and explores agglomeration and size distribution.
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NexION 350 ICP-MS Spectrometers
PerkinElmerWhen your instrument is more efficient and productive, so too are your scientists and your lab. And nothing puts the flow in your workflow better than the NexION® 350 ICP-MS. With a data acquisition speed 10 times faster than any other ICP-MS on the market, the new NexION 350 ICP-MS opens up a whole new world of efficiency and opportunity, allowing you to measure more in less time, and accurately characterize nanoparticles. In addition to the exceptional application flexibility afforded by its speed, the instrument also delivers superior uptime and productivity through a variety of unique features engineered to enhance signal stability: Triple Cone Interface produces the industry’s most tightly focused ion beam and prevents sample deposition on internal components. Quadrupole Ion Deflector turns positively charged ions 90° into the Universal Cell and filters off neutrals. Analyzing Quadrupole made of a unique steel alloy for negligible thermal expansion for unparalleled stability. No extraction lenses to clean for minimized maintenance.