3D optical microscopy for orthopedic implants

22 Jun 2023

This application note discusses Bruker’s 3D optical microscopy technique in both the research and development and quality control stages of orthopedic implants manufacturing. The benefits of this technique include non-contact and non-destructive characterization, an insensitivity to material type, a large dynamic range to measure very rough and very smooth surfaces, quick, accurate and repeatable areal measurements, and the capability for complete automation to measure a batch of parts and perform pass-fail summaries based on user-specified parameters.

ContourX-500

Bruker Nano Surfaces and Metrology

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.

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3D optical microscopy for orthopedic implants