Electron Microscopy Products & Reviews

LaB6 EPMA

Direct Write E-beam Lithography System

E-Beam Mask/Reticle Writer

Atomic Resolution TEM

High-throughput Analytical S/TEM

Ion Beam Cross Section Polisher (CP) 

Field Emission Auger Microprobe

Cutting Edge in FIB sample preparation, imaging and analysis

The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).  

High-Resolution Schottky VP FE-SEM

High-performance Ar+ ion polisher

FIB-SEM optimised for large-volume 3D examinations

The fully digital TEM / STEM for all applications, available in 3 models

UV-Ozone Sample Cleaner for TEM

Compact SEM with low vacuum function

UV-Ozone Sample Cleaner for SEM

Standard Ar+ cross-section and surface polisher

High-Resolution FE-SEM with Cold Field Emitter

FIB-SEM for the semiconductor sector with 200mm wafer coverage

FIB-SEM for the highest demands on TEM samples

Segmentation of subcellular structures from 3-dimensional electron microscopy (EM) data

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics

Inlens FE-SEM and STEM

60-200kV ETEM with maximum resolution