ZEISS MultiSEM 505/506 - Fast SEM Designed for Continuous Operation by ZEISS Research Microscopy Solutions

Revolutionize the Speed of Electron Microscopy

With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution. This unique scanning electron microscope (SEM) is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and your MultiSEM will acquire high contrast images automatically, all by itself.

You control MultiSEM with the proven ZEN imaging software from ZEISS: all options of this powerful SEM are organized in an intuitive yet flexible way.