ZEISS EVO Family
Your Interactive SEM for Multi-User Environments
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The ZEISS EVO series combines high definition scanning electron microscopy with an intuitive user-friendly experience.
Discover substantial improvements in productivity and dramatically reduced training costs with SmartSEM touch user interface. Empower all users to generate excellent images and achieve highest throughput for visual inspection workflows.
SmartSEM touch is a welcome addition in the multi-user environment. Experience excellence in high vacuum (HV), variable pressure (VP) and extended pressure (EP) imaging, thanks to the latest detector technology. Significant improvements in signal yield and contrast ratio herald a step change in imaging efficiency.
EVO is a highly flexible, easy-to-use, high definition imaging and analysis tool delivering fast, accurate, repeatable results across all samples.
Microstructural Investigation of Austempered Ductile Iron (ADI) with "Shuttle & Find"
Austempered ductile iron (ADI) excels through strength, wear resistance and toughness – characteristics that make ADI the material of choice for use in combustion engines and gear box components. This means that safety aspects are also involved in addition to purely functional aspects. For this reason, changes in the ADI production process need to be monitored with respect to the material's characteristics and must be optimized systematically. For the micro- and nanoscopic analysis of the structure and precipitations, scientists typically use both light and electron microscopes. To date, however, there has been no possibility of relocating regions of interest without doubt when transferring the sample from the light to the electron microscope or vice versa. "Shuttle&Find" – the interface for correlative microscopy in materials analysis — offers an easy-to-use solution, enabling seamless integration of these two complementary technologies for the first time.
Investigating Solid State Materials using SEM with Integrated Raman Spectrometers
The following application note presents the use of non-destructive Raman spectroscopy for the detection, identification and quantification of solid state materials, such as graphene. In addition to the elemental analysis provided by energy dispersive x-ray (EDX) analysis as part of SEM, Raman analysis allows elucidation of many material characteristics, such as strain, stress and doping.
Zeiss Announces its New Release of the ZEISS Mineralogic Software
ZEISS Mineralogic v1.6 offers a bumper range of new capabilities
New Generation of ZEISS EVO Scanning Electron Microscopes Introduced
Modular platform for intuitive operation, routine investigations and research applications
