Member since: 2020
Organization: University of Kashan
Excellent durability and stability.
Application Area: X-ray diffractometry
"We've been using the device since 2004. We have found it very effective and useful for looking at the crystalline structures of a wide range of materials from bulk to nanomaterials."
Manufacturer's ResponseThank you Amir for your review, we are glad to hear that you found this product effective and useful for your needs.
Member since: 2010
Organization: Zhejiang University of Technology
"instrument gives excellent accuracy and is of good quality.Good intensity and rapid performance. It is easy to operate."
PANalytical's X'Pert3 Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:
It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
As well as the proven standard version of the Panalytical XPert3 MRD system, a number of special versions exist: