X'Pert3 MRD by Malvern Panalytical

Manufacturer Malvern Panalytical  |  Available Worldwide
4.5
/
5.0
  |  2 reviews
PANalytical's X'Pert3 Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for: Advanced materials science and nanotechnology Metrologic characterization in semiconductor process development It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as: Rocking curve analysis and reciprocal space mapping Reflectometry and thin film phase analysis Residual stress and textur... Read more


X'Pert3 MRD by Malvern Panalytical product image
X'Pert3 MRD
Request Pricing

Receive your quote directly from the manufacturer.




Average Rating: 4.5
2 Scientists have reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2020

  • Organization: University of Kashan



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    4 out of 5
Share this Review on LinkedinShare this Review on TwitterShare this Review on Facebook
Excellent durability and stability.
Rating: 4.7

  • Application Area: X-ray diffractometry

"We've been using the device since 2004. We have found it very effective and useful for looking at the crystalline structures of a wide range of materials from bulk to nanomaterials."

Review date: 10 Feb 2020 | X'Pert3 MRD

Manufacturer's Response

Thank you Amir for your review, we are glad to hear that you found this product effective and useful for your needs.
  • Status:

    Reviewer

  • Member since: 2010

  • Organization: Zhejiang University of Technology



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    3 out of 5
Share this ReviewShare this Review on TwitterShare this Review
Rating: 4.3
"instrument gives excellent accuracy and is of good quality.Good intensity and rapid performance. It is easy to operate."

Review date: 16 May 2012 | X'Pert3 MRD

PANalytical's X'Pert3 Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:

  • Advanced materials science and nanotechnology
  • Metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:

  • Rocking curve analysis and reciprocal space mapping
  • Reflectometry and thin film phase analysis
  • Residual stress and texture analysis

As well as the proven standard version of the Panalytical XPert3 MRD system, a number of special versions exist:

  • With the XPert3 MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface
  • The X'Pert3 Extended MRD allows mounting of an X-ray mirror and a high-resolution monochromator in-line, increasing the intensity of the incident beam
  • The X'Pert 3 MRD XL meets all the high-resolution XRD analysis requirements of the semiconductors, thin films, and advanced materials industries
  • By facilitating analysis of wafers up to 300 mm in diameter, with a sophisticated, automatic wafer loader option, the X'Pert3 MRD XL becomes an advanced tool for thin film process development

Product Overview

X'Pert3 MRD by Malvern Panalytical product image

X'Pert3 MRD

Manufacturer Malvern Panalytical  |  Available Worldwide

4.5 / 5.0 | 2 reviews