V-780 UV-Visible/NIR Spectrophotometer
The V-780 UV-Visible-Near Infrared (UV-Vis/NIR) spectrophotometer features a monochromator with automatically exchanged dual gratings: 1200 lines/mm for the UV/VIS region; 600 lines/mm for the NIR region. A PMT detector is provided for the UV-visible region and a high sensitivity InGaAs photodiode detector is employed for the NIR region. Both gratings and detectors are automatically exchanged within the user selectable 800 to…
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The V-780 UV-Visible-Near Infrared (UV-Vis/NIR) spectrophotometer features a monochromator with automatically exchanged dual gratings: 1200 lines/mm for the UV/VIS region; 600 lines/mm for the NIR region. A PMT detector is provided for the UV-visible region and a high sensitivity InGaAs photodiode detector is employed for the NIR region. Both gratings and detectors are automatically exchanged within the user selectable 800 to 900 nm range.
Luminous color measurement
In this application note, JASCO introduces methods for evaluating luminous colors and color rendering by a JASCO spectrophotometer for the development of LED, Organic EL, and PDP displays. Moreover, a method for evaluating the colors of liquid crystal displays (LCD) using the same system is also introduced.
Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern
In this application note, the thickness of the SiO2 layer on a sample was analyzed from an obtained reference spectra using the MSV-5000 from JASCO. The MSV-5000 series micro-spectrophotometer is ideal for transmission and reflection measurements of samples as small as 10 μm diameter over a wide wavelength range from the ultraviolet to the near-infrared wavelengths.
Estimation of the Refractive Index of Monocrystalline Sapphire by Polarization Measurements using the MSV-5000 Series
This application note illustrates how polarization measurements were obtained for a sample of monocrystalline sapphire and used to calculate the dispersion of the refractive index. The MSV-5000 series micro-spectrophotometer is ideal for transmission and reflection measurements of samples as small as 10 μm diameter over a wide wavelength range from the ultraviolet to the near-infrared wavelengths.
