Ultim® Extreme
Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.
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Super Sensitive at low kV
Energy dispersive spectroscopy
Easy to use. Maps in seconds. Excellent training and follow up webinars.
Review Date: 19 Nov 2021 | Oxford Instruments NanoAnalysis
Superb instrument, very innovative.
Chemical composition
The Ultim Extreme brings a whole new level to EDS in the FE-SEM. The service is extraordinary. The ability to work at a smaller working distance is a perfect marriage of the Ultim Extreme and FE-SEM.
Review Date: 5 Nov 2019 | Oxford Instruments NanoAnalysis
A windowless 100 mm2 version of Ultim, this detector was designed to optimise sensitivity and spatial resolution. Utilising radical geometry allows the highest standard of both imaging and EDS performance even at short working distances and at low kV.
Features:
- Sub 10 nm element characterisation in the FEG-SEM
- Sensitivity for surface science
- Material characterisation down to the lowest kV
- Real-time nano-characterisation
- Sensitivity for light elements such as lithium, nitrogen and oxygen
