Talos F200i for Materials Science by Thermo Fisher Scientific
Manufacturer Thermo Fisher Scientific
More productivity, more flexibility—more materials science
Talos F200i for Materials Science
Average Rating: 4.5
2 Scientists have reviewed this product
Status:
Expert Reviewer
Member since: 2020
Organization: A.D.Patel Institute of Technology
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- Ease of use
- After sales service
- Value for money
Perfect to resolve depth and structure of the material.
Rating: 4.7
Application Area: Material Science
"Product is most effective for material scientist. Every time most reliable and reproducible results are obtained. I will recommend to all material scientist."
Review date: 17 Dec 2021 | Talos F200i for Materials Science
Status:
Reviewer Member since: 2021
Organization: CSIR-IICT
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- Ease of use
- After sales service
- Value for money
Very important instrument and is very critical to research on designing materials.
Rating: 4.3
Review date: 14 May 2021 | Talos F200i for Materials Science
Application Area:Materials characterization, size morphology and structural evaluation
"Transmission electron microscopy is an effective tool and very critical technique for routine materials characterization especially nanostructured materials. Along with EDS and SAED it gives a lot of information of the elemental composition and the crystallinity the facets exposed. By correlating this study with the performance it is very effective in predicting and structure-property correlation. This is an emerging field of research and is gaining importance in several fields of materials development for device applications."
Review date: 14 May 2021 | Talos F200i for Materials Science
The Thermo Scientific™ Talos™ F200i S/TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.
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