MultiMode 8-HR

In this application note from Bruker, explore the PeakForce SECM™, a complete commercial solution for atomic force microscopy (AFM)-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution. A number of applications are detailed that showcase how the PeakForce SECM capability is helping enable multidisciplinary research in a wide arena of markets.

The structure and mechanical properties of sub-micron features in materials are of particular interest due to their influence on macroscopic material performance and function. Atomic force microscopy has the high resolution and force control to directly probe the mechanical properties of a wide range of these materials. In this application note from Bruker, consider the development and implementation of several new features that improve the flexibility, accuracy, and productivity of atomic force microscopes in measuring such important material properties as modulus and adhesion.

Machine learning, is a powerful tool to establish the presence (or absence) of correlations between microstructure and bulk properties with its ability to flesh out relationships and trends that are difficult to establish otherwise. In this application note from Bruker, explore the use of deep learning tools, such as convolutional neural nets (CNNs), to explore atomic force microscopy (AFM) phase and PeakForce QNM® images of impact copolymers, a polymer blend of polypropylene with micro-sized domains of rubber.

In this application note from Bruker, explore the MultiMode® platform’s success which is based on its combination of high resolution, performance, versatility, and productivity. The new MultiMode 8-HR™ AFM takes full advantage of these developments to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FastForce Volume™, and exclusive Bruker probes technology.

The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring the mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with Bruker’s PeakForce QNM®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. In this application note, explore the principles and benefits of the PeakForce QNM imaging mode.

Atomic force microscopy (AFM)-based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Tunneling AFM (TUNA), cover the lower current range (sub-pA up to nA). Bruker has developed an enhanced TUNA module with its proprietary PeakForce Tapping™ mode of operation that makes significant improvements to all three of these elements to enable exquisite tip-sample force control, quantitative nano-mechanical material property mapping through PeakForce QNM™, correlated nanoscale electrical property characterization through TUNA, and extreme ease of use through the ScanAsyst™ image optimization algorithms. A special probe has also been designed for use on particularly challenging samples. In this application note, explore the basics of PeakForce TUNA™, and compare it to standard Contact Mode–based TUNA.

PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two atomic force microscope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note, explore the underlying physical background, see how PFT fits into the framework of existing AFM modes, and discover the benefits of the new modes through application examples.

Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive atomic force microscopy (AFM), has been recognized as the two most used nanoscale electrical characterization tools, complementing each other. In this application note from Bruker, explore how limited spatial resolution and lack of measurement repeatability and accuracy have limited KPFMs usefulness in some critical areas, such as in the identification of donor and acceptor domains in bulk heterojunction organic solar cells, material differentiation in composite materials, and trapped charges on insulators.