Leica EM TXP Target Surfacing System by Leica Microsystems EMEA

Manufacturer Leica Microsystems EMEA  |  Available in Western Europe, Eastern Europe, Middle East, Africa
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.


Leica EM TXP Target Surfacing System by Leica Microsystems EMEA product image
Target Surfacing System Leica EM TXP
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The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.

With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.

For research use only