Leica EM TXP Target Surfacing System by Leica Microsystems
Manufacturer Leica Microsystems
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.
Target Surfacing System Leica EM TXP
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.
An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.
With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
For research use only
Product Overview
Leica EM TXP Target Surfacing System
Manufacturer Leica Microsystems
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