Efficiency and flexibility
The Triple Ion Beam Cutter, Leica EM TIC 3X allows the production of cross-sections of hard/soft, porous, heat-sensitive, brittle, and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. Three ion beams (individually controlled), cooling stage and multiple sample stage ensure milling at high rates, cutting broad and deep into the sample resulting in high-quality cross-sections. With the EM TIC 3X you achieve high-quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near-native state as possible.
The doubled ion milling rate of the latest EM TIC 3X can be further enhanced with the option of five different stages adapted to your application requirements.