Jupiter XR AFM by Oxford Instruments NanoAnalysis
Manufacturer Oxford Instruments NanoAnalysis | Available Worldwide
The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.
Jupiter XR AFM
Highest Performance
- Higher resolution than any other large-sample AFM
- Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
- Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation
Simpler User Experience
- Fully-motorized laser and detector setup eliminates manual adjustment of knobs
- Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
- Sharp top-view optics help you easily locate your precise region of interest
- Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner
Versatility for Diverse Research Needs
- Support for a full range of imaging modes
- Modular design makes it fast and simple to add accessories and future upgrades
- Flexible software makes routine measurements easy while enabling advanced research
Product Overview
Jupiter XR AFM
Manufacturer Oxford Instruments NanoAnalysis | Available Worldwide
Be the first to review this product