Jupiter XR AFM by Oxford Instruments America Inc.

Manufacturer Oxford Instruments America Inc.  |  Available Worldwide

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

Jupiter XR AFM by Oxford Instruments America Inc. product image
Jupiter XR AFM

Oxford Instruments America Inc.

The supplier does not provide quotations for this particular product through SelectScience. You can search for similar products in our product directory.

0 Scientists have reviewed this product

Write the First Review

No Reviews

Highest Performance

  • Higher resolution than any other large-sample AFM
  • Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
  • Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

  • Fully-motorized laser and detector setup eliminates manual adjustment of knobs
  • Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
  • Sharp top-view optics help you easily locate your precise region of interest
  • Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

  • Support for a full range of imaging modes
  • Modular design makes it fast and simple to add accessories and future upgrades
  • Flexible software makes routine measurements easy while enabling advanced research