Jupiter XR AFM
The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.
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Highest Performance
- Higher resolution than any other large-sample AFM
- Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
- Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation
Simpler User Experience
- Fully-motorized laser and detector setup eliminates manual adjustment of knobs
- Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
- Sharp top-view optics help you easily locate your precise region of interest
- Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner
Versatility for Diverse Research Needs
- Support for a full range of imaging modes
- Modular design makes it fast and simple to add accessories and future upgrades
- Flexible software makes routine measurements easy while enabling advanced research
Oxford Instruments announces winner of the 2021 Sir Martin Wood Prize
Prize awarded for the development of software that provides a significant impact on the investigation of the properties of materials
Oxford Instruments NanoScience partners on three Innovate UK projects to enable the next generation of quantum computers
The partnerships hope to resolve the challenges to scale up and commercialization, enabling the implementation of quantum computing to real-world applications
Oxford Instruments Asylum Research releases variable magnetic field module accessory for Jupiter XR
The exclusive accessory can be configured for the magnetic field to be applied either in-plane with the sample or out-of-plane.
