Jupiter XR AFM by Oxford Instruments America Inc.

Manufacturer Oxford Instruments America Inc.  |  Available Worldwide

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.


Jupiter XR AFM by Oxford Instruments America Inc. product image
Jupiter XR AFM

Oxford Instruments America Inc.

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Highest Performance

  • Higher resolution than any other large-sample AFM
  • Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
  • Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

  • Fully-motorized laser and detector setup eliminates manual adjustment of knobs
  • Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
  • Sharp top-view optics help you easily locate your precise region of interest
  • Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

  • Support for a full range of imaging modes
  • Modular design makes it fast and simple to add accessories and future upgrades
  • Flexible software makes routine measurements easy while enabling advanced research