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JIB-PS500i FIB-SEM by JEOL USA

Manufacturer JEOL USA
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Cutting Edge in FIB sample preparation, imaging and analysis
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JIB-PS500i FIB-SEM

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Fast high-quality TEM sample preparation. FIB, SEM imaging and EDS analysis in a single instrument. Robust workflow with TEM-Linkage.

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JIB-PS500i FIB-SEM by JEOL USA product image

JIB-PS500i FIB-SEM

Manufacturer JEOL USA

Be the first to review this product