The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode.
The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs corrector. For the electron source the user has the choice between either Schottky Emission or Cold Field Emission.
The HD-2700 has applications in materials science, semiconductors and nanotechnology, both in research and development and quality control.
High speed, high sensitivity EDX analysis (solid angle greater than 0.3sr) is possible since the HD-2700 has 10x greater probe current than other models in the HD-series. This allows extremely rapid acquisition of elemental distribution images even for elements at low concentration. It is possible to mount dual EDX detectors onto the HD-2700 column for even higher sensitivity EDX analysis. Electron Energy Loss Spectrometry is also available for analysis of light elements with enhanced spatial resolution.
Extremely versatile imaging allows simultaneous multiple-image acquisition and display with a wide variety of combinations including SE/BF, SE/DF, BF/DF, DF/EDX and DF/EELS.
The HD-2700 enjoys the same simplicity of operation as other models in the HD-series and has the same sample holder which is fully compatible with the Hitachi FB-2100 Focused Ion Beam System ensuring seamless interchange between the instruments.