Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.
Due to its low infrastructural requirements, Epsilon 4 can be placed next to the production line anywhere in your process. Its high performance enables most applications to be operated at ambient conditions, reducing costs for helium or vacuum maintenance.
The Epsilon 4 handles a wide variety of sample types, including solids, pressed and loose powders, liquids and filters. It performs non-destructive quantitative analysis of elements from carbon (C) fluorine to americium (Am), in concentrations from 100% down to sub-ppm levels, on samples weighing anything from a few milligrams to kilograms.
The Epsilon 4 is a robust and reliable alternative to conventional systems for a wide variety of industries and applications, even when light element analysis is of outmost importance, including: cement production, mining, mineral beneficiation, iron, steel and non-ferrous metals, RoHS screening and quantification, petroleum and petrochemicals, polymers and related industries, glass production, forensics,
pharmaceuticals, healthcare products, environmental, food and cosmetics.