alpha300 A Atomic Force Microscope
The WITec alpha300 A atomic force microscope features exceptional capability along with an uncommon versatility.
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The WITec alpha300 A atomic force microscope features exceptional capability along with an uncommon versatility. It combines AFM with a research-grade optical microscope. The seamless integration of the two techniques allows simultaneous cantilever and sample observation for user-friendly cantilever positioning and rapid alignment.
WITec’s unique inertial drive AFM module and TrueScan dynamic position error correction provide exceptional mechanical precision and reproducibility. Switching between AFM and optical mode is simply a matter of rotating the objective turret.
A wide selection of measurement modes is available. Whether you work in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 A allows local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.
The alpha300 A can be optimized for a particular experiment, or it can upgraded as experiments develop and change. It features rock-solid stability, the freedom of modularity, and an optical microscope worthy of the name WITec.
Applications:
• Materials science
• Geoscience
• Life sciences
• Nanotechnology
• Nanolithography
• Polymer science
Atomic Force Microscopy - Temperature Dependent Properties of Polymers
Atomic force microscopy (AFM) is one of the most powerful methods available for surface characterization. The forces which interact between tip and sample can be used to map surface topography on the nanometer scale. In this application note, AFM is used to characterize the temperature dependant properties of polymers.
Digital Pulsed Force Mode – Polymer Differentiation
The Digital Pulsed Force Mode (DPFM) provides new perspectives for materials research on the nanometer scale. Its ability to store the full tip-sample interaction during an AFM imaging process allows the user to record, along with the topography, mechanical and energetic properties. In this application note, material properties on the nanometer scale of two rubber compounds are presented.
Digital Pulsed Force Mode - Adhesion and Separation Mode
For the development of adhesive tapes and films, fundamental knowledge of adhesive properties on the microscopic scale is essential. This application note demonstrates that Atomic Force Microscope and Digital Pulsed Force Mode enable the investigation of adhesive tapes in detail.
Digital Pulsed Force Mode – Thin Layers of Polyvinylalcohol
For many technical applications, achieving a deeper understanding of the surface structures of thin polymer films on various substrates is an important goal. Atomic Force Microscopy (AFM) is a technique which is perfectly suited to the needs of these studies. In many cases not only the topography, but also material properties of the surface are of great interest. The Digital Pulsed Force Mode provides a convenient way to perform such measurements. This application note describes the analysis of a polyvinylalcohol polymer film using the WITec alpha300 A System under control of the Digital Pulsed Force Mode.
Atomic Force Microscopy - Imaging of Cell Surfaces
The alpha300 A from WITec combines a scientific optical microscope with a Scanning Probe Microscope. This unique combination is indispensible, when investigating highly transparent specimens in life science. In this application note the capabilities of the alpha300 A are shown by examining Hela cells. The resulting high resolution AFM images revealed many more details on the cell surface than a comparative optical image.
