3View System
Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.
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The 3View® system provides high resolution imaging of a wide variety of in situ samples in 3D and offers high throughput. The 32k x 24k image support and high performance stages allow fully automated high speed imaging of several types of samples.
Features:
- Large format image support (32k x 24k) allows very large images to be collected, and decreases the amount of time wasted waiting for stage motion when imaging extremely large regions.
- Serial block-face imaging reduces distortion and errors found when using focus ion beam imaging or traditional serial section imaging.
- High performance back-scatter detector allows high-speed imaging at low kV without compromising image quality.
- <50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion.
- 15 nm Z section thickness without requiring multi-kV images to be unblurred.
The 3View can use serial block face scanning electron microscopy, or SBFSEM, to obtain serial images. Between each image, a microtome inside the chamber equipped with a diamond knife is used to remove a layer of the sample less than 50 nm thick. This is a fully automated process, meaning that large volumes of data can be acquired rapidly whilst eliminating the risk of human error.
