The 3View® system provides high resolution imaging of a wide variety of in situ samples in 3D and offers high throughput. The 32k x 24k image support and high performance stages allow fully automated high speed imaging of several types of samples.
The 3View can use serial block face scanning electron microscopy, or SBFSEM, to obtain serial images. Between each image, a microtome inside the chamber equipped with a diamond knife is used to remove a layer of the sample less than 50 nm thick. This is a fully automated process, meaning that large volumes of data can be acquired rapidly whilst eliminating the risk of human error.