Expert Insight: Latest Gemini technology for ultimate microscopic characterization of challenging samples

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Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions

Across the globe, scientists are finding increasing applications for microscopic characterization using field emission scanning electron microscopes (FE-SEM), especially in line with current research trends within the various sectors such as nanotechnology, miniaturization of devices, life sciences, as well as in designing and discovery of novel materials.

In this SelectScience webinar, microscopy expert Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions, will highlight how the industry-leading Gemini technology was pioneered, the latest ZEISS FE-SEM portfolio, and its benefits for ultimate microscopic characterizations of challenging samples.

Key learning objectives

• Benefits of the advanced Gemini technology
• The new ZEISS FE-SEM portfolio
• Examples of challenging applications: e.g. low-kV imaging and chemical mapping, imaging of magnetic domains, electron channelling contrast imaging (ECCI), 3D STEM for high resolution tomography

Who should attend?

• Managers of core facilities and microscopy centers, scientists or research professionals in materials science, semiconductor/electronics, life science in academia, government, and industry
• Ph.D. students, talented young researchers who are interested in microscopic characterizations

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary for continuing education purposes.

This webinar will run on Tuesday, December 15, at:

• 16:00 GMT
• 17:00 CET
• 08:00 PST
• 11:00 EST

Register for this webinar here>>

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