Across the globe, scientists are finding increasing applications for microscopic characterization using field emission scanning electron microscopes (FE-SEM), especially in line with current research trends within the various sectors such as nanotechnology, miniaturization of devices, life sciences, as well as in designing and discovery of novel materials.
In this SelectScience webinar, microscopy expert Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions, will highlight how the industry-leading Gemini technology was pioneered, the latest ZEISS FE-SEM portfolio, and its benefits for ultimate microscopic characterizations of challenging samples.
Key learning objectives
Who should attend?
Certificate of attendance
All webinar participants can request a certificate of attendance, including a learning outcomes summary for continuing education purposes.
This webinar will run on Tuesday, December 15, at:
SelectScience runs more than 10 webinars a month across various scientific topics, discover more of our webinars here>>