Uniscan Instruments Introduce a New Cell for Topographic Measurements

29 Mar 2011
bridget bridget
Laboratory Director

Product news

Uniscan Instruments has announced the introduction of the Shallow µTriCellTM for the M370 Scanning Electrochemical Workstation for use in a variety of practical applications including corrosion monitoring, development of electrochemical sensors and the screening of fuel cell materials.

The SECM technique may require topological relief of features in a sample’s surface. The constant-height area scan, where the probe remains at a fixed vertical position above the sample, is not ideally suited to this type of sample with a non-flat surface. To overcome this Uniscan Instruments have developed a constant-distance related technique where the probe is able to track the surface topology of a sample. The combination of the Optical-Surface Profiling (OSP370) technique with the Scanning Electrochemical Microscope (SECM370) allows a user to take a measure of the surface features and relieve the SECM probe’s position during the scan.

With the introduction of OSP-SECM topographical relief capability, the range of electrochemical cell options has been expanded to facilitate these types of experiments with an alternative sample holder that allows greater optical access to the sample surface.

The provision of a quartz window in the cell allows the positioning of the probe to be monitored with the VCAM2 zoom-lens video microscope system.

Uniscan manufactures a wide range of electrochemistry and corrosion measurement instrumentation including multi-channel and portable potentiostats and novel Scanning Electrochemical Workstation systems designed to quantify and map electrochemical reactions in two dimensions.

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.BiomarkersBiomarkers are biological markers which can be measured and evaluated to indicate a biological state. The use of biomarkers in research and diagnosis can indicate a normal or disease state or drug response of cells / tissues. Biomarkers include genetic markers, cell surface markers such as antigens, antibodies or receptors and secreted molecules such as cytokines. An assay system is required for identification of biomarkers. :ProfilometersProfilometers are instruments used to measure a surface's profile, in order to quantify etch depth, deposited film thickness, and surface roughness. They operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Uniscan Instruments Introduce a New Cell for Topographic Measurements