Rigaku to Present Latest X-ray Analytical Instrumentation at 2015 MRS Fall Exhibit
Rigaku will showcase its XRD, XRF and Raman technology at the 2015 MRS Fall Meeting & Exhibit in Boston
24 Nov 2015
Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman spectroscopy instrumentation at the 2015 MRS Fall Meeting & Exhibit, Sunday, November 29, 2015 through Friday, December 4, 2015. The event is organized by the Materials Research Society and will be held at the Hynes Convention Center in Boston, Massachusetts. Rigaku, a global leader in X-ray analytical instrumentation, will be exhibiting at the event at booth #712.
The conference is the leading event for those in the field of materials research, and will showcase a wide range of product and service categories such as thermal processing equipment; electronic and electrical properties instruments; deposition equipment, processes and materials; materials characterization equipment; optical components and equipment and microscopes, including electron microscopy.
Materials analysis instruments from Rigaku range from benchtop devices, suited for researchers employing X-ray techniques, to high-end instruments with advanced analytical capabilities. Among the instruments on display at the event will be the fifth generation Rigaku MiniFlex benchtop X-ray diffraction instrument. The MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials
Related Products
Request Quote for All Products
MiniFlex Benchtop XRD
Rigaku CorporationNew 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case
Supermini 200 Benchtop WDXRF Spectrometer
Rigaku CorporationThe new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Not only is the Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.Supermini 200 Benchtop WDXRF Spectrometer Features: Analyze oxygen through uranium (O → U) Analyze: solids, liquids, powders, alloys and thin films Atmosphere: air, helium or vacuum X-ray tube: 50 kV, 200 W Pd-anode Primary beam filter: Zr is standard; Al optional Detectors: F-PC and scintillation Crystals: 3-position changer Autosampler: 12-position standard Vacuum: rotary pump standard Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A