Rigaku to Feature Latest Instruments at 60th Biophysical Society Meeting

Rigaku will be in attendance at 60th Biophysical Society Meeting Saturday, February 27, 2016 to Wednesday, March 2, 2016 Los Angeles, CA, presenting their single crystal and SAXS products at Booth #828

29 Jan 2016
Lois Manton-O'Byrne, PhD
Executive Editor

Industry news

Rigaku Corporation is pleased to announce its attendance at the 60th Biophysical Society Meeting Saturday, February 27, 2016 to Wednesday, March 2, 2016 in Los Angeles, CA. Information about both small angle X-ray scattering (SAXS) and single crystal X-ray diffraction instrumentation products from Rigaku will be presented in Booth #828.

The BioSAXS™-2000 system is an updated version of its popular 2D Kratky system for small angle X-ray scattering of biological samples. The BioSAXS-2000 includes the new OptiSAXS optic, which captures a larger angle of the X-ray source to provide more than double the flux at the sample position enabling faster data collection with higher signal-to noise, thereby offering a beamline experience for home laboratory SAXS experiments.

Single crystal X-ray diffraction instrumentation from the Rigaku Oxford Diffraction division will also be featured. These instruments are used to determine three dimensional atomic structures of small molecules. The range of small molecule crystallography systems from Rigaku is designed to address the particular needs of any given lab, group or department. Through this new division, Rigaku offers complete expertise and the latest technology to meet the most vigorous small molecule crystallographic requirements.

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Structural BiologyX-Ray SourceCrystallographySmall Molecules