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Rigaku Oxford Diffraction Presents Latest X-Ray Analytical Solutions at CSCM 2016

Rigaku Corporation
20 Sept 2016
Lois Manton-O'Byrne, PhD
Executive Editor

Industry news

Rigaku Corporation is pleased to announce its sponsorship of the 24th Croatian-Slovenian Crystallographic Meeting (CSCM24). The conference is taking place September 21st to September 25th 2016 in Croatia.

The meeting is organized jointly by the Croatian Crystallographic Association and the Slovenian Crystallographic Society, under the auspices of the Department of Mathematical, Physical and Chemical Sciences of the Croatian Academy of Sciences and Arts (HAZU).

Rigaku Oxford Diffraction, representing its diverse lines of single crystal X-ray diffraction (XRD) instrumentation, will conduct an oral presentation, “Advances in Crystallography”.

Rigaku Oxford Diffraction is a leader in the field of single crystal analysis, both in the field of chemical crystallography as well as macromolecular crystallography. Formed in 1951, Rigaku Corporation is a leading analytical instrumentation company based out of Tokyo, Japan.

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.CrystallizationCrystallography

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Rigaku Oxford Diffraction Presents Latest X-Ray Analytical Solutions at CSCM 2016