Pacific Nanotechnology announces the Environmental Cell– a new standard for tip scanning AFM

PNI sets a new standard for ease of use enabling the user to easily change the experimental environment around a sample as well as simplifying sample changing between experiments.

To enable characterization of the surface properties of a sample using AFM (Atomic Force Microscopy), the operator needs to be able to change the environment of study. Experiments carried out purely under ambient conditions will not reveal all properties as when the experiments are made under different conditions such as changing the gas or liquid. By changing the environment, the user can perform in-situ experiments which may be more like the sample would undergo in an end use application. Examples may include the study of a human hair and its reaction to different shampoos; the growth of cellular material on a metal surface; crystal growth and dissolution; surface oxidation.

PNI sets a new standard for ease of use enabling the user to easily change the experimental environment around a sample as well as simplifying sample changing between experiments. The Environmental Cell chamber is created by making a seal between the AFM scanner and the top of the sample holder or puck. This seal is made of latex and is sufficiently flexible to make it possible to translate the sample several millimeters to find the optimum imaging region.

Describing users’ reactions to PNI’s EC, Chief Technical Officer, Dr. Paul West, said “the ability to change both the sample and the environment without having to completely dismantle the cell between experiments means sample throughput is increased and users no longer fear the pitfalls found in earlier commercially-designed systems.”

The Environmental Cell option is a package designed for PNI’s Nano -R LL-AFM system and comes with all the accessories required to scan samples in gaseous and liquid environments. A product data sheet on the EC as well as the many other SPM products from PNI may be found at their web site.