µ-FTIR in Failure Analysis & Troubleshooting
2 Jun 2020
Bruker invites you to join application specialist Eric Klein in an upcoming webinar showing the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. This webinar will be provided as an on-demand webinar afterwards.
About the samples:
The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface. The second sample is a standard particle trap, which was used to understand contamination routes and prevent the reoccurence of particle contaminations. Register now!
In this webinar you'll learn:
- How to FTIR microscopy is used to analyze contaminations.
- How to apply the LUMOS II FTIR microscope
- How to evaluate using OPUS software
Register now for the live event on Thu, Jun 4, 2020 3:00 PM - 4:00 PM BST
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LUMOS II FTIR Imaging Microscope
Bruker OpticsThe LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FTIR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: Extremely fast FTIR imaging (FPA) High spectral quality and resolution Brilliant visual images and huge field of view Fully automated FTIR microscope Integrated, piezo-controlled ATR crystal Software supported measurement and evaluation Automatic measurement in transmission, reflection and ATR Plenty of space between sample stage and lens Analyze samples up to 40 mm in height