Electron Microscopy Sciences Offers Graphene Support Films

10 Mar 2010
Sarah Sarah
Marketing / Sales

Product news

Electron Microscopy Sciences announced the addition of graphene transmission electron microscope support films to its product line. The new graphene support film provides an invisible, crystalline background that enables the unrivaled TEM characterization of organic and inorganic nanomaterials.

Graphene is a single atomic layer of carbon atoms tightly packed in a two-dimensional honeycomb lattice. This novel material is atomically thin, chemically inert, consists of light atoms, and possesses a highly ordered structure. Graphene is electrically and thermally conductive, and is the strongest material ever measured. These remarkable properties make graphene the ideal support film for electron microscopy.

The graphene used in the support films is produced by the substrate-free gas-phase method which is the first and only process that can synthesize ultrahigh-quality graphene in a single step, without the use of substrates or graphite This technique results in graphene with a highly ordered structure that is composed of 99% carbon by mass (1% hydrogen) and can be used to directly image gold nanoparticles and their organic surface molecules in both conventional and atomic-resolution TEMs at a level that greatly surpasses any current TEM support film.

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.