CamScan Announces the Apollo 300, TFE SEM at Microscience 2006

CamScan unveiled their new Apollo 300 Field Emission Scanning Electron Microscope at the Microscience 2006 International Conference and Exhibition at ExCel London on 27th June 2006.

The Apollo 300 complements the present range of high quality SEMs and combines exceptional Analytical qualities for simultaneous multi-detector analysis (including EDX, WDX and EBSD) with low accelerating voltage and Delphi through-lens imaging.

The Apollo 300 maintains CamScan’s excellent reputation for reliability, build quality and exceptional performance.

This meeting proved to be very successful for CamScan with a great deal of interest being shown for the new product. It was also confirmed that the first of these instruments will be delivered to a prestigious engineering college in the UK in the near future.