Bruker AXS Introduces New X-ray Source-Detector Combination

At the Denver X-ray Conference, Bruker AXS Inc., a leading global developer and provider of life science, materials research and industrial X-ray analysis tools, and Incoatec GmbH, Germany, a developer of X-ray optical components, today introduced a new Super Speed X-ray source-detector combination to further enhance current high-performance Bruker AXS instruments, including the popular Bruker D8 DISCOVER with GADDS and the well-regarded Bruker NANOSTAR.

The new Bruker Super Speed Solutions are powered with Incoatec’s Microfocus Source, the IµS, which is a sealed high brilliance micro focus tube in combination with a “Quazar” Montel multilayer optic for 2D beam shaping. The 30W source is low-weight and runs air-cooled, making it ideal for customer applications and customer convenience.

Bruker’s VÅNTEC-2000 detector is a large 2D MikroGap detector for XRD². This detector is a true photon-counter with no intrinsic noise and extremely high quantum efficiency. Inert conversion gas permits maintenance-free operation at extreme counting-rates.

Bruker AXS Inc. and Incoatec physicists have recently tested several Montel models of different optical designs for various XRD² applications. The new source-detector combination showed dramatic flux/speed increases at the same resolution.

Uwe Preckwinkel, Bruker AXS’ North American XRD product manager, said: “Up to two orders of magnitude increase in intensity and excellent sampling statistics were achieved in high-throughput transmission applications with excellent resolution. This new lean source-detector combination will be displayed at the DXC on a Bruker Theta/Theta diffractometer. Data will be presented during technical presentations there.”

Dr. Ian Steele, Senior Research Associate from the Department of Chemistry and Geophysical Sciences at the University of Chicago, commented: ”We came to Bruker AXS in Madison to see the first demonstration of a D8 DISCOVER with GADDS with the combination of IµS and VÅNTEC-2000 to test reflection applications in Nanotechnology and Materials Science. I am very impressed with respect to the intensity, resolution and ease of operation of this set-up, especially when compared to conventional instrumentation.”