Beckman Coulter Diagnostics Features Latest Microbiology Offerings at 115th General Meeting of the American Society for Microbiology

Beckman Coulter Diagnostics will demonstrate its newest microbiology offerings and a new level of workflow efficiency for the microbiology laboratory at the 115th General Meeting of the American Society for Microbiology (ASM) Annual Meeting in New Orleans, LA, May 30 – June 2, 2015. This year’s booth will highlight the power of one smart solution, where accuracy is speed with Beckman Coulter’s customizable microbiology automation solutions.

The Beckman Coulter exhibition booth (#517) will showcase the company’s latest additions to its diagnostic portfolio for microbiology, acquired from its acquisition of Siemens’ Microbiology Business earlier this year. The Beckman Coulter Smart Microbiology Automation Solution includes:

• The MicroScan WalkAway plus System, which provides high-quality performance and reliability for automated ID/AST testing. This customizable solution is adaptable and scalable to meet varying laboratory needs and is backed by 30 years of ID/AST testing experience.
• The Copan WASP and WASPLab, which are designed to improve specimen processing productivity by 30-45%* while increasing quality and reducing turnaround time.
• Bruker MALDI Biotyper identifications combined with MicroScan MIC panels, which provide the optimum combination of accuracy and speed.
• Introducing LabPro-MBT, which provides a convenient software solution that seamlessly combines AST results by the MicroScan WalkAway plus System with the rapid ID of the Bruker MALDI Biotyper System, enhancing workflow and improving clinical impact.

Tours will be held in the Beckman Coulter booth every 30 minutes to showcase the integration of the MicroScan product portfolio with strategic partner products. Visit www.beckmancoulter.com/ASM to request a tour.

In addition to the exhibition booth, Beckman Coulter will be featured in the following poster presentations at the General Meeting:

Multicenter Evaluation of Vancomycin MIC Results for Staphylococci and Enterococci Using MicroScan Dried Gram Positive MIC Panel
Sunday, May 31, 2015, 10:45 AM ‐ 12:00 PM
Poster Board Number: 109
Humphries RM, Hindler JA, Schreckenberger PC, Tjhio J, Polage CR, Weinstein MP, Evans M, Brookman RK, Chau JY, Roe-Carpenter D UCLA David Geffen School of Medicine, Los Angeles, CA, Loyola University Medical Center, Maywood, IL, UC Davis Medical Center, Sacramento, CA, Rutgers Robert Wood Johnson Medical School, New Brunswick, NJ and Siemens, West Sacramento, CA

Multicenter Evaluation of Vancomycin MIC Results for Staphylococci and Enterococci Using MicroScan Dried Gram Positive MIC Panels Read on the WalkAway System and autoSCAN-4 Instrument
Sunday, May 31, 2015, 10:45 AM ‐ 12:00 PM
Poster Board Number: 120
Humphries RM, Hindler JA, Schreckenberger PC, Tjhio J, Polage CR, Weinstein MP, Evans M, Brookman RK, Chau JY, Roe-Carpenter D UCLA David Geffen School of Medicine, Los Angeles, CA, Loyola University Medical Center, Maywood, IL, UC Davis Medical Center, Sacramento, CA, Rutgers Robert Wood Johnson Medical School, New Brunswick, NJ and Siemens, West Sacramento, CA

Multicenter Evaluation of Clindamycin MIC Results for Staphylococci Using MicroScan Dried Gram Positive MIC Panels
Sunday, May 31, 2015, 10:45 AM ‐ 12:00 PM
Poster Board Number: 119
R.M. Humphries, J.A. Hindler, P.C. Schreckenberger, J.Tjhio, C.R. Polage, M.P. Weinstein, M. Evans, R.K. Brookman, A.M. Chipman, J.Y. Chau, D. Roe-Carpenter UCLA David Geffen School of Medicine, Los Angeles, CA, Loyola University Medical Center, Maywood, IL, UC Davis Medical Center, Sacramento, CA, Rutgers Robert Wood Johnson Medical School, New Brunswick, NJ and Siemens Healthcare Diagnostics-Microbiology Business Unit, West Sacramento, CA

Evaluation of MicroScan Dried Overnight Panels to Accurately Detect Meropenem Resistance with Challenge Gram-Negative Isolates
Sunday, May 31, 2015, 12:30 PM - 1:45 PM Poster Board Number: 530A
M. Chipman, R. K. Brookman, A. M. Austerman, K. Dawa, D. Roe-Carpenter, M. J. Arndt, B. L. Zimmer