ResourceSpectroscopy

Coated wafer mapping using UV-Vis spectral reflection and transmission measurements

22 Mar 2021

In this application note, Agilent describes a new autosampler capability for the Agilent Cary 7000 UMS with rotational and radial sample positioning control.

Cary 7000 Universal Measurement Spectrophotometer

Agilent Technologies

The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight, or characterize optical components or thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution for research, development, and QA/QC in optics, thin films/coatings, solar, and glass.

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Coated wafer mapping using UV-Vis spectral reflection and transmission measurements