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Personalized medicine: Emerging organoid models to better treat prostate cancer
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This product brochure describes the features of the ZEISS integrated atomic force microscope - a combination of atomic force microscopy (AFM) with your ZEISS scanning electron microscope (SEM) or focused ion beam-SEM (FIB-SEM).
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ZEISS GeminiSEM for Materials
The GeminiSEM Family
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