MTF vs Interferometry – A New On-Line Datasheet From P-OE

9 Oct 2009

Product news

MTF vs Interferometry – A New On-Line Datasheet From P-OE Precision-Optical Engineering (P-OE) has published the latest in its series of on-line Interferometry Technical Datasheets.

IF007, “Wavefront Distortion Measurements - MTF vs Interferometry” compares and contrasts the use of dedicated MTF measurement systems and interferometers for testing optical components in the infra-red region of the spectrum. This new datasheet can be downloaded as a PDF file from the Technical Library section on the P-OE website: www.p-oe.co.uk.

The change in shape of a wavefront passing through or being reflected from an optical system, compared to the incident wavefront is an indication of the quality of the optical components. A quality indicator is the Modulation Transfer Function (MTF) of the image. The two common methods of measuring MTF in optical components in systems are: Fourier transform of measured linespread function andinterferometric measurements.

The datasheet covers experimental arrangements as well as trade-offs in measurement time vs accuracy. A practical example of the benefits of both techniques in the design of zoom optical telescopes is given.

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InterferometryInterferometry is an investigative technique used to analyze the pattern of interference created during the superposition of 2 or more waves. An interferometer is used to produce 2 or more overlapping waves. The interferometer is comprised of 2 or more telescopes, a detector and a correlator. The interferometer detector may utilize homodyne or heterodyne detection of the interference pattern.