Application Notes
Uncovering Tumor Heterogeneity in FFPE Samples by Laser Capture Microdissection and Next-Generation Sequencing
Uncovering Tumor Heterogeneity in FFPE Samples by Laser Capture Microdissection and Next-Generation Sequencing
Uncovering Tumor Heterogeneity in FFPE Samples by Laser Capture Microdissection and Next-Generation Sequencing
Application of PIPS II System for Cross-sectional TEM Specimen Preparation of Semiconductor Devices
Imaging of Nano-Carbon Samples with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM (RISE)
Microscopy in the Field of Tool Engineering - the Microstructure of Hard Metal Drills