Spectroscopic Ellipsometry for CIGS Thin Films Characterization

CIGS is one of the most efficient solar cell absorbers and used in a number of solar cell structures. Consequently, non-destructive characterization of the material is very important. This application note presents a convenient approach to the ellipsometric characterisation of CIGS, using an optimised surface etch method tailored to minimize the errors in optical properties determination induced by surface roughness.