ResourceSpectroscopy
ROHS Rapid Screening by Benchtop XRF
24 Oct 2012This application note describes the measurement of Cr, Hg, Pb, Br and Cd in polyethylene (PE) by XRF rapid screening using the empirical method. The Rigaku NEX QC gives the user a reliable and low-cost tool for measuring the toxic metals in PE and similar polymers for screening incoming raw materials and during the production process.
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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.PolyethyleneToxic MetalsPolymersPolymers are large molecules made up of many repeat units. Natural polymers such as DNA and proteins are essential to life, whereas synthetic polymers such as polystyrene and polyethylene are used widely due to their functionality. Typical techniques for analysis include GPC, SEC, DSC, FT-IR and NMR.
