ResourceSpectroscopy

Quantitative Analysis of Low Alloy Steel using the ZSX PrimusIII+

15 Feb 2013

In this application note it is shown that accurate analysis of the elements in low alloy steel can rapidly be performed using the ZSX PrimusIII+ from Rigaku. High alloys such as stainless steel and nickel alloy can also be effectively analyzed with high precision. The ZSX PrimusIII+ is optimized for process control of steelmaking including the analyses of slag and ferroalloys.

ZSX Primus III+

Rigaku Corporation

Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets.EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps.ZSX Primus III+ Features: Analysis of elements from O to U Tube above optics minimizes contamination issues Small footprint uses less valuable lab space High precision sample positioning Special optics reduce errors caused by curved sample surfaces Software tools for statistical process control (SPC) Evacuation and vacuum leak rates can be optimized for throughput

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Process DevelopmentProcess development aims to optimize the performance of manufacturing systems. This involves the assessment of quality and efficiency of both processes and products. This is particularly important in the scale-up of chemical processes.Process OptimizationProcess optimization involves improving the efficiency, cost-effectiveness, and quality of processes in various industries, including manufacturing, pharmaceuticals, and biotechnology. Explore process optimization solutions in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.Alloy Steel