Graphene characterization with Raman spectroscopy
14 Mar 2025Graphene’s remarkable electron transport properties, extreme mechanical strength, and high thermal conductivity make it revolutionary for next-generation nanoelectronic devices. With electronic mobilities exceeding 15,000 cm²V⁻¹s⁻¹ and a strength over 200 times that of steel, graphene is poised to play a key role in the future of ultrafast transistors, microcircuits, and computer chips.
However, accurately characterizing graphene — distinguishing layer numbers, assessing disorder, and understanding structural integrity — is crucial for its practical applications. Raman micro-spectroscopy has emerged as an essential tool for graphene research, offering:
- Non-destructive, high-resolution analysis of graphene’s structural properties
- Rapid and reliable identification of layer number and disorder impact
- Precise spectral and spatial resolution for material characterization
- A standard method for graphene-based device development
Explore how Raman spectroscopy enables fast, accurate, and reproducible graphene analysis, accelerating innovation in nanoelectronics.
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XploRA™ PLUS
HORIBA ScientificRaman imaging has never been so fast! Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.The simplicity and power of the XploRA PLUS is unmatched with an enhanced range of options such as multiple laser wavelengths, EMCCD detection, Raman polarisation and even Raman-AFM combination.XploRA™PLUS Features: SWIFTTM 10x faster Raman imaging Improved detection and sensitivity Full Confocality for complete image detail Full optical microscope so you can see your samples Maximum detail, resolution and range for enhanced spectroscopy HORIBA’s OneClick easy Raman analysis NIST traceable and patented Autocalibration options for validated results Ultimate optical stability- robust, reliable, long term operation Automated operation offering simple, powerful reliability 2 year base unit warranty as standard