ResourceSpectroscopy
fleX-Beam: Deisgned for flexibility and unyielding performance
24 Mar 2020In this application note, XOS introduces the fleX-Beam™ designed to be a compact X-ray generator that combines a low-powered X-ray source and a precisely-aligned polycapillary optic to deliver a bright X-ray beam for advanced material analysis.
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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.ImagingImaging techniques are essential for obtaining visual representations of samples to understand structures, processes, and function in biological, chemical, and physical research. These tools range from traditional light microscopy to advanced imaging modalities like MRI and electron microscopy, providing researchers with valuable data for diagnostics, drug discovery, and material analysis. Explore imaging solutions in our peer-reviewed product directory to compare products, check reviews, and get pricing directly from manufacturers.X-Ray Source