Correlating advanced 3D optical profiling surface measurements to traceable standards

22 Jun 2023

In this application note, Bruker Nano describes the advantages of the non-contact inspection method employed by 3D optical profilers, and discusses the best practices and measurement results for some specialized physikalish-technische bundesanstalt (PTB) traceable roughness standards and other low-cost fingernail roughness gages. The correlation results are based on measurement factors that should be understood and considered when imaging and analyzing surface textures that range in roughness from a few nanometers to micrometers in scale.

ContourX-500

Bruker Nano Surfaces and Metrology

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.

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Correlating advanced 3D optical profiling surface measurements to traceable standards