Accurate Determination of Film Thickness by Fast-Scanning IR

From special lenses and mirrors with a specific coating to semiconductor components with surface-doped substrates. All of these products need their respective surfaces measured for QC or R&D purposes, but are too thin for direct physical measurement and too difficult to measure with cross-sectional microscopy. This application note discusses the benefit of a scanning based system which provides the best quality data for this analysis and specifically demonstrates the capabilities of the Buck Scientific M500 Scanning IR System.