AFM / STM Probes
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm…
K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact ProbeThis versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG01AFM-mode non-contact probe:…
K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory. Available Options with the K-TEK NSG03 AFM Mode Non Contact Pr…
K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG10 non-contact AFM probe: -PtIr, TiN, and Au tip coatings -CoCr…
K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG20 AFM non-contact probe: -PtIr, TiN, and Au tip coatings -CoCr mag…
K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG30 AFM Non-Contact Probe: -PtIr, TiN, and Au tip coa…
K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the FMG01 AFM Mode Non-Contact Force Modulation Probe: -PtI…
K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG01 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic ti…
K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG10 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip…
K-TEK CSG11 AFM Mode Contact ProbeThis versatile CSG11 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG11 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip c…
K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe: -PtIr…
HA_NC Etalon AFM Mode Contact Probe from K-TEK NanoK-TEK Nanotechnolgy's dual cantilever Etalon probe features: • High aspect ratio tip • Precisely specified resonant frequency • Enhanced reflection • Economic price Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: • Standard chip size: 1.6x3.6x0.45 mm. • High reflective Au coating. • Typical curvature radius of a tip: 10 nm. • Total tip height : 9 - 16 µm. •…
K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the tip of the probe, users are able to investigate rather complicated surfaces with relative ease.
K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips provide users with a durable, long lasting product. To guarantee 20nm working length of DLC tips TEM is used. 10% from total number of probes in the batch are selected for…
K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC AFM tips provide users with a durable, long lasting product. NSG10 DLC AFM tip specification: Material – diamond-like carbon Curvature radius - 1-3nm. Working length - >20nm Probe…
TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip c…
TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip…
TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip coati…
TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and complementary Au tip coating, the T…
TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip…
