Non-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry. Better contrast enables higher-quality tomographies to be acquired an order of magnitude faster while achie…
The Q-Sense Omega Auto is a fully automated Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) system for real-time characterization of interfaces and molecular interactions.
The Q-Sense E4 is a 4-channel quartz crystal microbalance for rapid analysis of molecular interactions at surfaces.
Q-Sense E1 is a flexible, single-sensor microbalance system that enables accurate QCM-D measurements of real-time molecular interactions.
The CI-600/602 Minirhizotron Systems take non-destructive, high-resolution digital color images of roots while they are living in soil.
Rigaku’s Radioflex EGM2 series directional radiographic testing systems are tried and tested. They are characterized by their reliability and robustness. Their rugged design caters to the rigors of in-field testing, while their proven dependability ensures they are ready to go when you are. These systems are built to last, while the high-performance ceramic X-ray tubes will provide years of operation.
FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ellipsometer is ideally suited for use in academic and R&D settings investigating the thickness and uniformity of ultra-thin films.
