Materials Products & Reviews

The most affordable research grade Atomic Force Microscope with flexible sample handling

The leading automated nanometrology tool for 300 mm wafer measurement and analysis

NX-Wafer is the wafer fab Atomic Force Microscope with automatic defect review (ADR) that improves defect review productivity by up to 1,000%

Park 3DM Series is the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. 

FTIR based Gas Analyzer for the fully automated and real-time quantification of gas compounds. Features: • Continuous and fully automated quantification of gas compounds • No calibration to target gas necessary • Compensation of interferents • Temperature-controlled gas cell (up to 191°C) • Spectral resolution better than 2 cm-1 (Option: better than 1 cm-1) • TE cooled detector • The nickel-plated gas cell and gold…

High-Resloution Atomic Force Microscope for academic and industrial large sample research and failure analysis

Atomic force microscope with built-in white light interferometry profilometry (WLI) for semiconductor and related applications 

Park NX-Mask is the most effective, safe and efficient Photomask Repair System for High-end EUV Mask Repairs.

Bring your FT-IR lab to the field: MOBILE-IR II

High plex proteomics instrument for spatial biology

Fast track precise spatial multiplexing

The IR Biotyper ® , leveraging FT-IR spectroscopy, enables swift, user-friendly, and cost-effective same-day typing of microbial strains for applications in hospital hygiene, epidemiology, industrial hygiene control, and source tracking.   

The NanoRam-1064 is a high-performance handheld Raman Spectrometer for nondestructive identification and verification of incoming raw materials, such as APIs, excipients, and intermediates, regardless of their color.

The TacticID®-1064 ST is a 1064 nm handheld Raman analyzer for rapid field identification of explosives, narcotics, and other suspicious materials.

Vision Air is Metrohm’s universal software for Vis-NIR spectroscopy.

MIRA XTR DS handheld Raman spectrometer 

High-Resolution Schottky VP FE-SEM

High-performance Ar+ ion polisher

FIB-SEM optimised for large-volume 3D examinations

The fully digital TEM / STEM for all applications, available in 3 models

UV-Ozone Sample Cleaner for TEM

Compact SEM with low vacuum function

TIDAS is the go-to system for Hegman grind gauge/grindometer testing; removing operator variation and ensuring reproducability. The system's robust, low-maintenance design, super-sharp imaging, customisability and versatility make it must-have for your R&D or QC lab.

UV-Ozone Sample Cleaner for SEM

Standard Ar+ cross-section and surface polisher