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ZEISS Xradia Versa X-ray Microscopes by ZEISS Research Microscopy Solutions

Manufacturer ZEISS Research Microscopy Solutions  |  Available Worldwide
5.0
/
5.0
  |  1 reviews
Discover More with Non-destructive 3D X-ray Imaging at Submicron Resolution


ZEISS Xradia Versa X-ray Microscopes by ZEISS Research Microscopy Solutions product image
ZEISS Xradia Versa X-ray Microscopes
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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Advanced Reviewer
  • Member since: 2020

  • Organization: National University of Singapore



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Great Product
Rating: 5.0

  • Application Area: Faster Sub-Micron Imaging of Intact Samples

"True spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm High resolution across a broad range of sample types, sizes, and working distances. In situ imaging for non-destructive characterization of microstructures in controlled environments and over time upgradeable and extendible with future innovations and developments. High throughput with good image quality."

Review date: 26 Mar 2022 | ZEISS Xradia Versa X-ray Microscopes

Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.

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