Member since: 2021
A good choice for routine sample inspection
Application Area: SEM imaging, FIB cross sectioning and lamella preparation
"Reliable optics, good energy range and depth of focus, efficient detectors and add-ons. GUI complete, yet update-able"
The ZEISS Sigma family combines field emission scanning electron microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity. Study new materials, particles for quality inspection or biological or geological specimens. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. Execute advanced analytical microscopy using best-in-class EDS geometry and get analytical data at twice the speed and with more precision.
With the Sigma family you are entering the world of high-end nano-analysis.