Symmetry® S3
Symmetry S3 is an all-in-one CMOS EBSD detector that combines speed, sensitivity and diffraction pattern quality for routine and advanced EBSD analysis.
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Symmetry S3 is a CMOS-based EBSD detector for microstructural characterisation in the SEM. It is designed to deliver high-speed data acquisition, high sensitivity and detailed diffraction patterns, supporting routine EBSD, advanced strain work and challenging materials analysis.
Key features / benefits:
• All-in-one EBSD detector based on advanced CMOS technology
• High indexing speeds with high-resolution EBSD pattern capability
• Fibre-optic, lens-free design supports sensitivity and low distortion
• Software-controlled detector tilting and strong integration with AZtec workflows
Relevant applications:
• EBSD phase and orientation mapping
• Texture, grain, boundary and strain analysis
• Metals, ceramics, semiconductors and geological materials
• Quality control, failure analysis and research microscopy
Materials science: Key technological advancements to celebrate
Electron backscatter diffraction: Moving toward the mainstream for crystalline material characterization
Dr. Pat Trimby reveals the innovations that have transformed EBSD from a specialized method to a workhorse for routine material analysis
